Hioki 3535 Overview
The Hioki 3535 LCR HiTESTER measures across the broad frequency range of 100kHz to 120MHz. The 6ms high-speed measurement capability is particularly useful with the built in comparator, load functions and BIN (classification) measurements. Achieve measurement flexibility by detaching the head amp unit fromt he main unit and placking it in proximity to the test object so as to minimize the effect of test leads on measurements.
- High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
- Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
- High speed LCR testing (6ms/sample)
- 14 Parameter Types ( |Z|, |Y|, T, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan d) and Q )
- Detachable Head Amp
- Load Compensation Function
- BIN ( Classification ) Measurement
