HP / Keysight / Agilent 81637B Overview
This realizes the ideal solution for e.g. swept lambda applications and the test of PDL critical devices. With one fast single wavelength sweep, WDM component characterization over wavelength is now possible at high speed and a high dynamic range.
Features:
- Data acquisition time: 25 uS
- Dynamic Range: 90dB (>55dB in a single range)
- Data storage: 100.000 data points
- Low Spectral Ripple