HP / Keysight / Agilent E6607C Overview
Anticipate your wireless device manufacturing test needs
- Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
- Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000®, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth®, GPS/GNSS, and more
- Ensure your test system is future proof due to its modern, scalable architecture
