IET 1687B Overview
- Test frequency of 1MHz
- Automatic Binning
- Designed for fast and easy high-frequency component testing
- The unit provides:
- A wide choice of measurement parameters
- A self-check diagnostic system
- A test speeds from 3 to 5 measurements per second
- Test voltages are:
- 10 mV
- 100 mV
- 1 Volt
