Tektronix P6330 Overview
Features:
Applications:
The Tek P6330 enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications.
The P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions.
The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
- 3.5 GHz Bandwidth
- Low Input Capacitance:
- > 60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz
- Small Probe Head Allows Easy Probing of SMDs
- Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
- Semiconductor Characterization & Validation (PCI-Express, Serial ATA, IEEE 1394, USB 2.0, RAMBUS, DDR)
- Disk Drive Design
The Tek P6330 enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications.
The P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions.
The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices.
